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ATOMIC RESOLUTION OF THE GRAPHITE SURFACE BY STM (SCANNING TUNNELING MICROSCPE)
SKU : CPI-PHYWE-P2532000
Harga : Call
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Approaching a very sharp metal tip to an electrically conductive sample by applying a electrical field leads to a current between tip and sample without any mechanical contact. This so-called tunneling current is used to investigate the electronic topography on the sub nanometer scale of a fresh prepared graphite (HOPG) surface. By scanning the tip line by line across the surface graphite atoms and the hexagonal structure are imaged.